Sparse Regression Driven Mixture Importance Sampling for Memory Design.

Maria Malik,Rajiv V. Joshi,Rouwaida Kanj,Shupeng Sun,Houman Homayoun, Tong Li

IEEE Transactions on Very Large Scale Integration (VLSI) Systems（2018）

Cited 6|Views38

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Abstract

In this paper, we present a sparse regression (SpaRe) model-based yield analysis methodology and apply it to memory designs with state-of-the-art write-assist circuitry. At the core of its engine is a mixture importance sampling technique which consists of a uniform sampling stage and an importance sampling stage. The proposed methodology allows for fast and accurate statistical analysis of rare f...

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Key words

Monte Carlo methods,Integrated circuit modeling,Analytical models,Predictive models,Radio frequency,Data models,Random access memory

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