A 1.8e $^{-}_{\mathrm {rms}} $ Temporal Noise Over 110-dB-Dynamic Range 3.4 $\mu \text{m}$ Pixel Pitch Global-Shutter CMOS Image Sensor With Dual-Gain Amplifiers SS-ADC, Light Guide Structure, and Multiple-Accumulation Shutter.

Masahiro Kobayashi,Yusuke Onuki,Kazunari Kawabata,Hiroshi Sekine,Toshiki Tsuboi,Takashi Muto, Takeshi Akiyama,Yasushi Matsuno,Hidekazu Takahashi,Toru Koizumi,Katsuhito Sakurai,Hiroshi Yuzurihara,Shunsuke Inoue,Takeshi Ichikawa

IEEE Journal of Solid-State Circuits（2018）

引用 62|浏览12

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摘要

A 1.8erms- temporal noise over 110 dB dynamic range 3.4 μm pixel pitch global shutter (GS) CMOS image sensor (C'S) single-slope analog digital converters (ADCs) with dual-gain amplifier (SSDG-ADC), light guide (LG) structure, and multiple-accumulation shutter has been developed for various accuracy required applications. The newly developed C'S pixel achieves low noise, high saturation, high sensi...

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关键词

Sensitivity,Micromechanical devices,Program processors,Timing,Linearity,Apertures,Image sensors

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