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METS: A multiple event transient simulator

Adam Watkins,Spyros Tragoudas

2017 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)（2017）

Cited 24|Views4
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Abstract
Most existing soft error simulators do not consider multiple event transients or use simple electrical masking models to model the pulse shape. In this paper, the METS tool is proposed which employs BDDs and partitioning for faster simulation. Additionally, it uses an accurate electrical masking model to determine the output pulse shape which allows for accurate calculation of the soft error rate in the presence of multiple event transients (METs). The tool is tested on various ISCAS 85 benchmarks and is shown to have a speedup of up to 90X compared to Monte Carlo simulation.
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Key words
METS,multiple event transient simulator,soft error simulators,electrical masking models,ISCAS 85 benchmarks,Monte Carlo simulation
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