What We Know After Twelve Years Developing And Deploying Test Data Analytics Solutions
PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC)（2016）
Abstract
Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/or removal, and operations monitoring. In this paper, key findings amassed during this time are summarized.
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Key words
outliers,Location Averaging,statistical post-processing,adaptive test
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