Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias.

IEEE Design & Test(2017)

引用 28|浏览4
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摘要
Soft errors not only are major threats to SRAM, but also have become a major threat to the reliability of logic circuits. This article proposes a new transmission-gate approach to filter out soft errors, and it is more efficient when to the thanks to its to compared state of art solutions, capability adjust gate and body bias voltages.
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关键词
Logic circuits,SRAM chips,Bandwidth allocation,Transmission gates
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