Optimization of Automated Crystal Orientation Mapping in a TEM for Ni 4 Ti 3 Precipitation in All-Round SMA

Automated crystal orientation and phase mapping in TEM are applied to the quantification of Ni 4 Ti 3 precipitates in Ni–Ti shape memory alloys which will be used for the implantation of artificial sphincters operating using the all-round shape memory effect. This paper focuses on the optimization process of the technique to obtain best values for all major parameters in the acquisition of electron diffraction patterns as well as template generation. With the obtained settings, vast statistical data on nano- and microstructures essential to the operation of these shape memory devices become available.