Iot: Source Of Test Challenges

2016 21TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)(2016)

引用 36|浏览104
暂无评分
摘要
The semiconductor industry has been driving a major part of its growth through first the PC and more recently the mobile market. Unfortunately, the PC market is in decline and also the end of the growth curve for mobile products is in sight now that virtually everyone on the planet has a smartphone and/or tablet. Hence, the semiconductor industry is putting its bets on 'Internet of Things' (IoT) as the next application wave that will allow them to sell a lot of silicon real estate. Although what exactly IoT encompasses is under definition and hence still volatile, the first emerging products depict an image which is quite different from the traditional microprocessors or smartphone SOCs: small but with ubiquitous presence, wirelessly connected, energy harvesting, equipped with smart sensors, secure, and low cost. All these aspects have a profound impact on the challenges, solutions, and associated trade-offs for testing IoT chips and provide rich grounds for research. This paper provides seven views from different angles.
更多
查看译文
关键词
semiconductor industry,mobile market,PC market,Internet of Things,IoT chips,silicon,microprocessors,system-on-chip,smartphone SOC,energy harvesting,smart sensors
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要