Testable MUTEX Design.

Yang Zhang,Leandro S. Heck,Matheus T. Moreira,David Zar,Melvin A. Breuer,Ney Laert Vilar Calazans,Peter A. Beerel

IEEE Transactions on Circuits and Systems I: Regular Papers（2016）

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摘要

The mutual exclusion element is a fundamental component of asynchronous arbiters. Despite their importance, however, the testability of these components is typically limited to functional testing. This paper discusses why this is not sufficient and investigates three MUTEX implementations, two of which are completely new, that support the test of the metastability filter part of the components. Ad...

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关键词

Circuit faults,Switches,Transistors,Testing,Logic gates,Inverters,Delays

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