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Simultaneous X-ray Fluorescence and Scanning X-ray Diffraction Microscopy at the Australian Synchrotron XFM Beamline.

Michael W. M. Jones,Nicholas W. Phillips,Grant A. van Riessen,Brian Abbey,David J. Vine,Youssef S. G. Nashed,Stephen T. Mudie,Nader Afshar,Robin Kirkham,Bo Chen,Eugeniu Balaur,Martin D. de Jonge

Journal of Synchrotron Radiation（2016）

引用 21|浏览36
关键词
X-ray fluorescence,scanning X-ray diffraction microscopy,ptychography
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