Multiple-Bit Parity-Based Concurrent Fault Detection Architecture for Parallel CRC Computation.

IEEE Transactions on Computers(2016)

引用 19|浏览10
暂无评分
摘要
As a result of huge advancements in VLSI technology, more and more complex circuits are being implemented making not only the whole digital system more prone to faults, but also the fault detector itself susceptible to faults resulting in the requirement of concurrent fault detection architecture of the encoders and decoders. In this paper, we present a multiple-bit parity-based fault detection ar...
更多
查看译文
关键词
Computer architecture,Fault detection,Electrical fault detection,Polynomials,Hardware,Generators
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要