Approximate SRAMs With Dynamic Energy-Quality Management.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2016)

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摘要
In this paper, approximate SRAMs are explored in the context of error-tolerant applications, in which energy is saved at the cost of the occurrence of read/write errors (i.e., signal quality degradation). This analysis investigates variation-resilient techniques that enable dynamic management of the energy-quality tradeoff down to the bit level. In these techniques, the different impacts of errors...
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关键词
Random access memory,Bit error rate,Degradation,Approximation methods,Measurement,Quantization (signal),Very large scale integration
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