An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution.

An FPGA-based instrument with capabilities of on-board oscilloscope and nanoscale pulsing (70 ns @ ±10 V) is presented, thus allowing exploration of the nano-scale switching of RRAM devices. The system possesses less than 1% read-out error for resistance range between 1 kΩ to 1 MΩ, and demonstrated its functionality on characterizing solid-state prototype RRAM devices on wafer; devices exhibiting ...