Built-in self-test structure for fault detection of charge-pump phase-locked loop.

A defect-oriented built-in self-test (BIST) structure of charge-pump phase-locked loop (CP-PLL) for high fault coverage and low area overhead test solution is proposed. It employs a new structure of phase/frequency detector, a D flip-flop and some existing blocks in the PLL as the input stimulus generator and fault feature extracted devices for testing evaluation. Thus, no extra test stimulus or h...