T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics

Microelectronics Reliability(2015)

引用 15|浏览12
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摘要
•A self-healing simulation model is built and its validation is verified.•Breakdowns in metallized PP film is classified and the differences are described.•The fuse burn out mechanism is investigated and the burn-out criteria is proposed.•A simulation model for T pattern segment film is built and is of reference value.
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关键词
Metallized polypropylene film capacitor,Segment metallized film,Fuse,Self-healing,Self-healing failure,Simulation
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