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Improved Analysis and Modeling of Low-Frequency Noise in Nanoscale MOSFETs

E. G. Ioannidis,C. A. Dimitriadis,S. Haendler,R. A. Bianchi,J. Jomaah,G. Ghibaudo

Solid-State Electronics（2012）

Cited 59|Views20
Key words
Analysis,Modeling,Low-frequency noise,Nanoscale,MOSFETs
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