High-Temperature Lattice-Parameters And Dta Of The Quaternary Compound Cugasn Class Se4

The variation of the lattice parameters, from the room temperature to the melting point of the compound, has been studied for the chalcopyrite semiconductor CuGaSn□Se4 by using a high-temperature X-ray camera. The compound shows an increase in the tetragonal of thermal expansionαc. The results are interpreted in terms of expansion of the bonds. The DTA measurement, that has shown a peak at 590°C, has been associated with the decomposition of the quaternary into two phases. At the temperature of 590°C extra lines appeared in the X-ray measurements of θ values of 15.3133o, 18.8235o, 21.0230o, 24.5633o, 26.3712o and 34.7926o. These new extra lines (second phase)_are probably from SnSe2.