Study of radiation-induced damage to type III–V semiconductor compounds irradiated with γ quanta and protons using positron annihilation spectroscopy

The effect of proton and γ radiation on characteristics of the spectra for the angular distribution of annihilation photons (ADAP) have been studied in the case of positron annihilation in GaAs and GaP single crystals. Relative variations in defect accumulation and annealing under irradiation and subsequent isochronous annealing of the samples have been studied using variations in the basic parameters of the ADAP spectra. In both cases (GaAs and GaP), the variations in the ADAP spectral parameters as functions of the annealing temperature have a steplike character, which is interpreted as the formation of a certain type of defects with different annealing activation energies.