Temperature-Dependent Measurements of Time-of-Flight Current Waveforms in Schottky CdTe Detectors

Temporal evolution of the time-of-flight current waveforms of Schottky CdTe detectors as a function of the DC bias duration has been measured at several different temperatures from 278 K to 315 K to investigate the nature of the defects responsible for the polarization phenomena. The electron transient current waveforms under the application of DC bias show polarization as evidenced by a change in...