T-x phase diagram of the Cu 2 S-Al 2 S 3 quasibinary System

B. V. Korzun,K. Bente, R. R. Mianzelen,Th. Doering, G. Kommichau,W. Schmitz,A. A. Fadzeyeva

Journal of Materials Science: Materials in Electronics（2005）

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摘要

The T-x phase diagram of the Cu 2 S-Al 2 S 3 system was achieved experimentally from 35 different mixtures of the binary compounds. The results of powder X-ray diffraction (XRPD), differential thermal analysis (DTA) and microprobe analysis (EPMA) are presented. The ternary phases CuAlS 2 and CuAl 5 S 8 were found and their homogeneity regions were established.

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关键词

Phase Diagram,Thermal Analysis,Electronic Material,Differential Thermal Analysis,Microprobe Analysis

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