Characterization of rf sputtered Sb 2 Te 3 thin films for back contacts to CdS/CdTe solar cells

Journal of Materials Science: Materials in Electronics(2014)

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摘要
We have studied the morphology and transport properties of magnetron sputtered Sb 2 Te 3 films including their suitability as back contacts for sputtered CdS/CdTe solar cells. Sb 2 Te 3 films were sputtered onto boro-aluminosilicate glass at temperatures from ~30 °C (room temperature) to 270 °C and characterized by X-ray diffraction, Hall-effect studies, and thermoelectric power measurements. Some films received post-deposition annealing up to 350 °C. Over these conditions, grain size reached 80 nm, hole carrier concentration 2 × 10 20 cm −3 , mobility 170 cm 2 /V s, and Seebeck coefficient 260 µV/K. Two-micron-thick CdS/CdTe solar cells completed with Sb 2 Te 3 /Mo back contacts yielded 10 % efficiency; however the addition of 3 nm of Cu after the Sb 2 Te 3 yielded >12 % efficiency. Comparative results are also given for 300 h of accelerated life testing under one-sun illumination at 85 °C.
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关键词
Solar Cell,Seebeck Coefficient,Sb2Te3,Back Contact,Accelerate Life Testing
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