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TECHNICAL NOTE: Effects of annealing conditions on photoelectrical properties of Ba1-xSrxNbyTi1-yO3 thin-film resistor

B Z Li,H B Lo,P T Lai,Yunrui Liu,G Q Li, Min Huang

Smart Materials and Structures(2006)

Cited 23|Views3
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Key words
dark current,visible light,grain boundary,thin film,scanning electron microscope
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