Polarization Mode Coupling and Emitted Optical Fields in Apertureless Scanning Near-Field Optical Microscopy Probes

Wataru Nakagawa,L. Vaccaro,Hans Peter Herzig,Christian Hafner

NANO（2006）

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摘要

We investigate the effect of structured and quasi-random defects in the metal coating of apertureless microfabricated SNOM probes on polarization mode coupling in the probe and on the emitted optical fields using rigorous modeling tools.

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