Atomic layer deposition of Al 2 O 3 and Al 2 O 3 /TiO 2 barrier coatings to reduce the water vapour permeability of polyetheretherketone

Thin Solid Films(2015)

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摘要
We demonstrate significantly enhanced barrier properties of polyetheretherketone (PEEK) against water vapour penetration by depositing Al2O3 or Al2O3/TiO2 nanofilms grown by atomic layer deposition (ALD). Nanoindentation analysis revealed good adhesion strength of a bilayer Al2O3/TiO2 coating to PEEK, while the single layer Al2O3 coating displayed flaking and delamination. We identified three critical design parameters for achieving the optimum barrier properties of ALD Al2O3/TiO2 coatings on PEEK. These are a minimum total thickness dependent on the required water vapour transmission rate, the use of an Al2O3/TiO2 bilayer coating and the application of the coating to both sides of the PEEK film. Using these design parameters, we achieved a reduction in moisture permeability of PEEK of over two orders of magnitude while maintaining good adhesion strength of the polymer–thin film system.
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关键词
Polyetheretherketone,Water vapour permeability,Atomic layer deposition,Thin film coating
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