Aspects of hybrid pattern definition while combining thermal nanoimprint with optical lithography

Thermal nanoimprint (T-NIL) is uniquely suitable for combinational lithography because it proceeds without cross-linking and does not rely on changes in properties of the imprint material. Most typical are combinations with other lithography techniques. Combinations with optical lithography may help to circumvent the pattern size dependence of nanoimprint and help to remove the residual layer by a simple development step. This work focuses on a hybrid processing combining T-NIL with optical lithography by using a single resist layer. Critical issues are the imprintability of typical photoresists and the fact that lithography has to be performed over a prepatterned topography. A well-known positive tone photoresist, AZ 1500, is compared with a previously investigated negative tone resist, SU-8. Gel permeation chromatography reveals typical differences of these photoresists compared to typical imprint polymers. The results demonstrate that molecular mobility is a more important indicator for viscosity of photoresists than molecular weight. Additionally, a simple construction method was found to allow prediction of features typically encountered during hybrid patterning. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3498750]