Modifications in device characteristics of La 0.6 Pr 0.2 Sr 0.2 MnO 3 /SrNb 0.002 Ti 0.998 O 3 manganites by swift heavy ion irradiation

Present study reports the device characteristics of epitaxially grown La 0.6 Pr 0.2 Sr 0.2 MnO 3 /SrNb 0.002 Ti 0.998 O 3 manganite before and after swift heavy ion irradiation at various ion fluences. The modification in the structural, morphological and electrical transport properties of La 0.6 Pr 0.2 Sr 0.2 MnO 3 /SrNb 0.002 Ti 0.998 O 3 have been explained based on defect formation and interface annealing effect. Various charge transport models are used to fit the I – V characteristics and the present study suggests that thermionic emission mechanism governs the transport in the pristine and irradiated devices. Irradiation induced variation in structural strain, crystallinity and surface roughness are responsible for the change in transport behavior in the devices.