MESFET cryogenic front‐end for cross‐correlation noise measurements

Gianluca Fiori,L Guidi,Massimo Macucci, Gianpaolo Basso,I A Maione,Bruno Pellegrini

AIP Conference Proceedings（2007）

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摘要

We present a dual-channel transimpedance amplifier for cross-correlation noise measurements with a MESFET cryogenic front-end and cooled feedback resistors. In order to test the noise performance of the system, devices with known noise power spectral density (i.e. resistors) have been measured. In particular, such a system has been able to reliably measure a noise current spectral density lower than 1 fA(2)/Hz in a bandwidth larger than 3 kHz.

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关键词

semiconductor devices,transimpedance amplifier,power spectral density,cross correlation,noise measurement,front end,spectral density

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