Diagnostic Development for Heavy-Ion Based HEDP and HIF Experiments
mag（2005）
摘要
Author(s): Bieniosek, F.M.; Baca, D.; Roy, P.K.; Seidl, P.A.; Yu, S.S.; Molvik, A.W.; Covo, M. Kireff; Shiraki, D.
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关键词
data analysis,space charge,phase space,secondary electron,optical imaging,high resolution,time of flight
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