A Method of Optimizing Mosfets through Engineering Knowledge-Based Analysis and Efficient Design of Experiments for 28nm Technology Node and Beyond

Shinshan Yu,T A Yang, Xin Shi, S F Yang,Yingyan Pu,Y K Ding, Zhifen Pan,J J Tao, Q J Zhang,B H Lee, Lin Fang, Hao Wu

mag（2014）

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