Effectiveness of Nitride Diffusion-Barriers in A Self-Encapsulated Copper-Based MetallizationAdams D.,Spreitzer R. L.,Russell S. W.,Theodore N. D.,Alford T. L.,Mayer J. W.MRS Proceedings（1994）引用 8|浏览4AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
