Imaging X-Ray Crystal Spectrometers (XCS) for Measurement of Ti and Flow-Velocity (v) Profiles in ITER

Bulletin of the American Physical Society(2010)

引用 23|浏览11
暂无评分
关键词
data analysis techniques,temporal resolution,x ray detector,flow velocity
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要