Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations

Alonzo Vera,Daniel Llamocca,Joe J Fabula,William Kemp, R D Marquez,W M Shedd,David R Alexander

NSRE: 2008 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD（2008）

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摘要

The results of ionizing dose rate experiments on XC5VLX50T FPGAs demonstrate the most susceptible upset mechanism of commercial devices and provide insight into the effectiveness of dose rate hardening of nano-scale technology by using epi substrates.

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关键词

field programmable gate array,field programmable gate arrays,voltage,nanotechnology,system on chip,prototypes,radiation hardening,epitaxial growth,oscilloscopes,shift registers

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