Variable range hopping behavior in the magnetic semiconductor SnO$_2$:Co

P.A. Stampe, R.J. Kennedy,Y. Xin,Erhong Hu,Peng Xiong

Bulletin of the American Physical Society(2005)

引用 23|浏览4
暂无评分
关键词
x ray diffraction,thin film,variable range hopping,magnetic semiconductor,physical properties
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要