High-resolution x-ray masks for the application of high-aspect-ratio microelectromechanical systems (HARMS)
Proceedings of SPIE(2003)
摘要
Challenging requirements in optical and BioMEMS application with high aspect ratios of microstructures in access of 20 and smallest structure details of less than I mum have motivated this work to improve x-ray mask fabrication. Several approaches to pattern an intermediate X-ray mask with the gold absorber thickness of 1.6similar to2.2 mum using a I mum thick silicon nitride membrane have been explored. E-beam lithography is employed for primary patterning and experimental results show that high energy (100keV) e-beam lithography is a very promising approach. So-called working X-ray mask can be fabricated from intermediate X-ray mask through x-ray lithography. More than 10 mum thick PMMA x-ray resist has been coated on the silicon nitride membrane by multi-coating process without crack. First exposure results indicate that adhesion and stability of sub-micrometer structures with these heights is critical. In order to overcome these problems a novel approach has been proposed by coating resist on both sides of the silicon nitride membrane and simultaneous patterning of both sides using x-rays. First successful experimental results have been achieved for proving the feasibility.
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关键词
X-ray mask,silicon nitride membrane,intermediate mask,HARMS
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