The Effect Of Rapid Thermal Annealing On The Performance Of Cigs Cells With An Ito Layer
2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)(2013)
Abstract
Rapid thermal annealing studies were conducted on SS/Mo/CIGS/CdS/ITO/Ag devices as a function of anneal time in dry N-2 in the temperature range 50 to 200 degrees C, as well as in humidified N-2 (85% RH) at 85 degrees C. Interestingly, dry N-2 annealing produced an enhancement in cell performance for low thermal budget, predominantly due to increased J(SC), and to a lesser extent higher V-OC. As examples, CIGS cell efficiency increased by 1.8 +/- 0.8% after annealing at 50 degrees C for 300s and 2.0 +/- 2.3% when annealed at 100 degrees C for 600s. At higher anneal temperature or longer time the cell performance deteriorated with significant decrease in FF and V-OC. The results for the 85% RH at 85 degrees C anneals were similar to the dry anneal studies but with less dramatic changes. Cell performance results after dark annealing indicate light-soaking effects induced by the lamp are not important at these relatively short anneal times. Measurement of quantum efficiency for the annealed samples supports the assumption that the buffer layer/absorber interface degrades at a relatively low temperature and that ITO degradation takes place at higher thermal budgets.
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Key words
CIGS,ITO,rapid thermal annealing,degradation,reliability
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