Electronic and chemical properties of non-vacuum deposited chalcopyrite solar cells

Keith Horsley,S Pookpanratana,S Krause,T Hofmann,M Blum,L Weinhardt,M Bar, K C George, J Van Duren, D Jackrel,C Heske

photovoltaic specialists conference(2011)

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摘要
We have investigated the electronic and chemical surface properties of a Cu(In 1−x Ga x )Se 2 (CIGSe) thin-film solar cell absorber and a CdS/CIGSe interface sample taken from Nanosolar's manufacturing line. Using soft x-ray and UV photoelectron spectroscopy, inverse photoemission, and soft x-ray emission spectroscopy employing high-brilliance synchrotron radiation, we have determined the chemical composition of the surface and near-surface bulk, as well as some of the relevant electronic structure parameters (e.g., the surface band gap of the absorber). We find that the (previously air-exposed) surfaces show a surprisingly low degree of carbon-containing surface adsorbates, the presence of sodium and selenium oxide species on the surface of both samples, a significant S/Se intermixing at the CdS/CIGSe interface, and, as is common for high-efficiency CIGSe absorbers after surface cleaning, an electronic surface band gap (1.45 ± 0.15 eV) that is noticeably larger than the optical bulk band gap.
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关键词
soft x ray emission spectroscopy,synchrotron radiation,thin film solar cell,band gap,chemical composition,electronic structure,inverse photoemission spectroscopy,photoelectron spectroscopy,photonic band gap,chemical properties,copper,three dimensional
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