Characterization of the Localized Surface Plasmon Ploariton Mode in Ag/SiO 2 /Ag T-Shaped Array

Integrated Photonics Research, Silicon and Nanophotonics and Photonics in Switching (2010), paper ITuB4(2010)

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摘要
The localized surface plasmon polariton mode in T-shaped Ag/SiO2/Ag array was demonstrated. The mode was characterized by a Fourier transform infrared spectrometer. The resonant wavelength can be manipulated by modifying the structure, broadening operation range.
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关键词
infrared,plasmonics,physical optics,optoelectronics
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