Characterization of the Localized Surface Plasmon Ploariton Mode in Ag/SiO 2 /Ag T-Shaped Array
Integrated Photonics Research, Silicon and Nanophotonics and Photonics in Switching (2010), paper ITuB4(2010)
摘要
The localized surface plasmon polariton mode in T-shaped Ag/SiO2/Ag array was demonstrated. The mode was characterized by a Fourier transform infrared spectrometer. The resonant wavelength can be manipulated by modifying the structure, broadening operation range.
更多查看译文
关键词
infrared,plasmonics,physical optics,optoelectronics
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要