Analysis of layer-by-layer thin-film oxide growth using RHEED and Atomic Force MicroscopyEli R Adler,M C Sullivan,Araceli Gutierrezllorente, H Joress,Arthur R Woll,Joel D BrockBulletin of the American Physical Society（2015）引用 23|浏览5暂无评分关键词thin-film thin-film,oxide,microscopy,layer-by-layerAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
