Stacked Devices For Seu Immune Design

P Oldiges,K P Rodbell,Tak H Ning,Jin Cai,David F Heidel, H C Tang,Larry Wissel,Michael S Gordon

2010 IEEE INTERNATIONAL SOI CONFERENCE（2010）

引用 7|浏览65

暂无评分

摘要

A stacked transistor on SOI shows the potential to provide soft error upset immune designs. Key design elements are presented and analyzed showing tradeoffs between standard SOI devices and stacked devices, as well as alternative layouts to optimize soft error upset immunity.

查看译文

关键词

soft error,silicon on insulator

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要