An in-situ Transmission Electron Microscopy study of Fluorine implantation induced damage in Si1-xGexA S Gandy, M Al Araimi,H El Mubarekmag(2011)引用 23|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要