Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

Eugene Normand,J L Wert, P Majewski,D L Oberg,William G Bartholet, Sabrina Davis, M A Shoga,S A Wender,A Gavron

radiation effects data workshop（1995）

Cited 16|Views4

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Abstract

Microelectronic devices used in avionics were tested in the WNR beam, simulating atmospheric neutrons. The SEU upset rates for ARINC 429 receivers agree with rates in memories, and neutron-induced latchup was measured in the LCA100 K and 200 K gate arrays and compared against a new neutron-induced latchup model.

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Key words

memories,system testing,avionics,latchup

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