Leakage current mechanisms in PECVD-grown amorphous hydrogenated boron carbide thin filmsBradley J. Nordell,Chris Keck,Justin Hurley,Thuong D. Nguyen,Sean W. King,Sudaunshu Purohit,Anthony N. Caruso,Michelle M. PaquetteBulletin of the American Physical Society(2014)引用 23|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要