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Prediction of radiation resistance of CMOS integrated microcircuits

F P Korshunov,Yu V Bogatyrev,A I Belous,S V Shwedov,S B Lastovsky, V I Karas,V I Kulgachev

international crimean conference microwave and telecommunication technology（2009）

Cited 23|Views5
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Abstract
The results of experimental researches and the calculating-experimental method of prediction of radiation resistance of logic CMOS integrated microcircuits at influence of fast electrons are submitted.
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Key words
radiation resistance,data mining,cmos integrated circuits,resistance
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