Near-field to far-field prediction for high-speed board using an empirical approach

Electrical Design of Advanced Packaging and Systems Symposium(2010)

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摘要
This paper describes a methodology to predict far-field (FF) emissions from a high-speed board based on the fields measured in the near-field (NF) region. The NF to FF transformation is based upon an empirical relationship between the measured fields in both the NF and FF regions. Initial results show that the predicted FF emissions from a high-speed board provide the designer a good confidence on the compliance of regulatory emission limits.
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关键词
emission,far field,near field,prediction
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