Copper interconnects with improved electromigration lifetimeChristy Woo, Jun Charlie Zhai,Paul R Besser, Kokyong Yiang,R C Blish,Christine Hauriegemag(2007)Cited 25|Views2No scoreAI Read ScienceMust-Reading TreeExampleGenerate MRT to find the research sequence of this paperChat PaperSummary is being generated by the instructions you defined