Magnetic ordering in Cr-doped Bi2Se3 thin films

We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be similar to 2.1 mu B per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of similar to 10 mT. The ferromagnetic transition temperature was determined to be 8.5K analyzing the magnetization-temperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface. Copyright (C) EPLA, 2014