Deep Co Penetration And Spin-Polarization Of C-60 Molecules At Hybridized Co-C-60 Interfaces

We used near-edge x-ray absorption fine structure spectroscopy to identify the interplays at organic semiconductor-ferromagnet interfaces. When monitoring the L-edge intensity of 0.36 nm Co depositing on C-60 films of various thicknesses, we detected weaker Co signal from structures with larger C-60 thicknesses. Having determined that the electron mean escape depth in C-60 is 4.9 nm, further model analysis indicates that the decline of spectral intensity is due to deep penetration of Co clusters. Finally, C K-edge spectra reveal clear evidences of orbital hybridization between Co and C-60 as well as a visible dichroic effect at 125 K. (C) 2014 AIP Publishing LLC.