Characterization Of Extreme Ultraviolet Emission Using The Fourth Harmonic Of A Nd : Yag Laser

APPLIED PHYSICS LETTERS(2005)

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Abstract
Characterization of an extreme ultraviolet (EUV) emission from laser-produced tin plasma was investigated for 266 and 1064 nm laser wavelengths. The EUV emission exhibits a laser-wavelength dependence in terms of angular distribution and structures of emission spectra. Angular distributions expressed in a form of I(theta) proportional to cos(alpha) theta became alpha=1.3 and 0.5, respectively, for 266 and 1064 nm laser wavelength. It is found that spectra from 266 nm laser plasma show dips at around 13.5 nm that had been well replicated in computer simulations. Both angular distribution and spectral structure at 13.5 nm suggest the existence of an opaque plasma region in front of the EUV source plasma generated by 266 nm radiation. (c) 2005 American Institute of Physics.
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Key words
extreme ultraviolet,computer simulation,plasma,wavelengths,emission spectra,tin
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