Investigation of Defect-Induced Abnormal Body Current in Fin Field-Effect-transistorsKuan-Ju Liu, Chang,Ching-En Chen,Ren-Ya Yang,Jyun-Yu Tsai,Ying-Hsin Lu,Xi-Wen Liu,Osbert Cheng,Cheng-Tung HuangApplied Physics Letters（2015）引用 1|浏览12AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
