Resonant X-Ray Reflectivity Study Of Perovskite Oxide Superlattices

APPLIED PHYSICS LETTERS(2011)

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摘要
Resonant x-ray reflectivity (XRR) is utilized to characterize the structural properties of La0.7Sr0.3MnO3/La0.7Sr0.3FeO3 superlattices. XRR spectra at the Mn and Fe absorption edges provide additional structural information compared to spectra obtained with a conventional Cu x-ray source. We demonstrate that this technique provides individual layer thicknesses and intermixing behavior of perovskite superlattices with small density contrast in a non-destructive manner. These results are consistent with scanning transmission electron microscopy and electron energy loss spectroscopy. (C) 2011 American Institute of Physics. [doi:10.1063/1.3660719]
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关键词
superlattices,scanning transmission electron microscopy,electron energy loss spectroscopy,x ray reflectivity
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