Computer Simulation On Spatial Resolution Of X-Ray Bright-Field Imaging By Dynamical Diffraction Theory For A Laue-Case Crystal Analyzer

JOURNAL OF APPLIED PHYSICS(2011)

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摘要
Recently, dark-field imaging (DFI) and bright-field imaging (BFI) have been proposed and applied to visualize X-ray refraction effects yielded in biomedical objects. In order to clarify the spatial resolution due to a crystal analyzer in Laue geometry, a program based on the Takagi-Taupin equation was modified to be used for carrying out simulations to evaluate the spatial resolution of images coming into a Laue angular analyzer (LAA). The calculation was done with a perfect plane wave for diffraction wave-fields, which corresponded to BFI, under the conditions of 35 keV and a diffraction index 440 for a 2100 mu m thick LAA. As a result, the spatial resolution along the g-vector direction showed approximately 37.5 mu m. 126 mu m-thick LAA showed a spatial resolution better than 3.1 mu m under the conditions of 13.7 keV and a diffraction index 220. (C) 2011 American Institute of Physics. [doi:10.1063/1.3651144]
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关键词
materials science,indexation,crystals,silicon,computer simulation,refraction,wave propagation,plane waves,x ray crystallography,spatial resolution,x ray diffraction
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